SIMPLIFIED COAGGLUTINATION TEST FOR SEROLOGICAL GROUPING OF BETA-HEMOLYTIC STREPTOCOCCIENGEL HWB; VAN SILFHOUT A.1981; J. CLIN. MICROBIOL.; ISSN 0095-1137; USA; DA. 1981; VOL. 14; NO 3; PP. 252-255; BIBL. 27 REF.Article

REFLECTOMETRIC STUDY OF DANGLING-BOND SURFACE STATES AND OXYGEN ADSORPTION ON THE CLEAN SI(III) 7 X 7 SURFACEWIERENGA PE; VAN SILFHOUT A; SPARNAAY MJ et al.1979; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1979; VOL. 87; NO 1; PP. 43-52; BIBL. 23 REF.Article

EFFECTS ON ELLIPSOMETRIC PARAMETERS CAUSED BY HEAT TREATMENT OF SILICON (111) SURFACE.KONO S; HANEKAMP LJ; VAN SILFHOUT A et al.1977; SURF. SCI.; NETHERL.; DA. 1977; VOL. 65; NO 2; PP. 633-640; BIBL. 11 REF.Article

THE INFLUENCE OF ARGON ION BOMBARDMENT ON THE ELECTRICAL AND OPTICAL PROPERTIES OF CLEAN SILICON SURFACESMARTENS JWD; VAN DEN BOGERT WF; VAN SILFHOUT A et al.1981; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1981; VOL. 105; NO 1; PP. 275-288; BIBL. 40 REF.Article

Decomposition of N₂O on the Si(100)2×1 and Si(111)7×7 surfaces; determination of the density of broken bondsKEIM, E. G; VAN SILFHOUT, A.Surface science. 1989, Vol 216, Num 1-2, pp L337-L341, issn 0039-6028Article

The Ti/c-Si solid reaction. III, The low-temperature reaction kinetics = La réaction à l'état solide Ti/Si-c. III, Cinétique de la réaction à basse températureDE NIJS, J. M. M; VAN SILFHOUT, A.Applied surface science. 1989, Vol 40, Num 4, pp 359-366, issn 0169-4332Article

A novel derivative ellipsometric method for the study of the growth of thin films: titaniumDE NIJS, J. M. M; VAN SILFHOUT, A.Thin solid films. 1989, Vol 173, Num 1, pp 1-12, issn 0040-6090, 12 p.Article

The influence of inter-atomic transitions in Auger valence band spectroscopy : oxygen on Si(001) 2×1WORMEESTER, H; BORG, H. J; VAN SILFHOUT, A et al.Surface science. 1991, Vol 258, Num 1-3, pp 197-209, issn 0039-6028Article

Noble-gas ion bombardement on clean silicon surfacesHOLTSLAG, A. H. M; VAN SILFHOUT, A.Physical review. B, Condensed matter. 1988, Vol 38, Num 15, pp 10556-10570, issn 0163-1829Article

INTERACTION OF OXYGEN WITH AN AISI 314 STAINLESS STEEL SURFACE STUDIED BY ELLIPSOMETRY AND AUGER ELECTRON SPECTROSCOPY IN COMBINATION WITH ION BOMBARDMENT = INTERACTION DE L'OXYGENE AVEC UN ACIER INOXYDABLE AISI 314. ETUDE PAR ELLIPSOMETRIE ET SPECTROMETRIE AUGER COMBINEES AVEC UN BOMBARDEMENT IONIQUESTOKKERS GJ; VAN SILFHOUT A; BOOTSMA GA et al.1983; CORROSION SCIENCE; ISSN 0010-938X; GBR; DA. 1983; VOL. 23; NO 3; PP. 195-204; BIBL. 27 REF.Article

The Ti/c-Si solid state reaction. I, An ellipsometrical study = Réaction à l'état solide Ti/Si-C. I, Une étude ellipsométriqueDE NIJS, J. M. M; VAN SILFHOUT, A.Applied surface science. 1989, Vol 40, Num 4, pp 333-347, issn 0169-4332Article

Adsorption of oxygen on the Si(110)5×1 surface via interaction with O₂KEIM, E. G; VAN SILFHOUT, A; WOLTERBEEK, L et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1988, Vol 6, Num 1, pp 57-62, issn 0734-2101Article

The desorption behaviour of implanted noble gases at low energy on silicon surfacesHOLTSLAG, A. H. M; VAN SILFHOUT, A.Surface science. 1987, Vol 187, Num 1, pp 36-57, issn 0039-6028Article

The behaviour of oxygen on Ni (110) investigated by ellipsometry and AES = Comportement de l'oxygène sur Ni (110) étudié par ellipsométrie et spectrométrie AugerHANEKAMP, L. J; VAN SILFHOUT, A.Journal de physique. Colloques. 1983, Vol 44, Num 10, pp C10.469-C10.472, issn 0449-1947Article

Reconstructions and phase transitions of the Ge(001) surfaceZANDVLIET, H. J. W; TERPSTRA, D; VAN SILFHOUT, A et al.Journal of physics. Condensed matter (Print). 1991, Vol 3, Num 4, pp 409-415, issn 0953-8984Article

An evaluation of the API-20 Strep system (rapid-Strep system) = Evaluation du système Strep API-20GROOTHUIS, D. G; ELZENAAR, C. P; VAN SILFHOUT, A et al.Systematic and applied microbiology. 1986, Vol 8, Num 1-2, pp 137-141, issn 0723-2020Article

C-axis oriented growth of magnetron sputtered YBaCuO thin films on MgO substratesHÄUSER, B; KEIM, E. G; ROGALLA, H et al.Applied physics. A, Solids and surfaces. 1988, Vol 46, Num 4, pp 339-341, issn 0721-7250Article

Deconvolution, differentiation and Fourier transformation algorithms for noise-containing data based on splines and global approximationWORMEESTER, H; SASSE, A. G. B. M; VAN SILFHOUT, A et al.Computer physics communications. 1988, Vol 52, Num 1, pp 19-27, issn 0010-4655Article

An evaluation of the API-20 strep system (Rapid-Strep system)GROOTHUIS, D. G; ELZENAAR, C. P; VAN SILFHOUT, A et al.Systematic and applied microbiology. 1986, Vol 8, Num 1-2, pp 137-141, issn 0723-2020Article

Identification of Klebsiella pneumoniae by DNA hybridization and fatty acid analysisSPIERINGS, G; VAN SILFHOUT, A; HOFSTRA, H et al.International journal of systematic bacteriology. 1992, Vol 42, Num 2, pp 252-256, issn 0020-7713Article

Order-disorder phase transition of the Ge(001) surfaceZANDVLIET, H. J. W; CASPERS, W. J; VAN SILFHOUT, A et al.Solid state communications. 1991, Vol 78, Num 5, pp 455-458, issn 0038-1098, 4 p.Article

Kinetic roughening of vicinal Si(001)HEGEMAN, P. E; ZANDVLIET, H. J. W; KIP, G. A. M et al.Surface science. 1994, Vol 311, Num 1-2, pp L655-L660, issn 0039-6028Article

Interaction between plasma sprayed YBaCuO on nimonic substratesLISOWSKI, W; HEMMES, H; JÄGER, D et al.Applied surface science. 1992, Vol 62, Num 1-2, pp 13-20, issn 0169-4332Article

The double cell technique : a discrete dipole approach towards surface opticsPOPPE, G. P. M; WIJERS, C. M. J; VAN SILFHOUT, A et al.Solid state communications. 1991, Vol 78, Num 8, pp 773-777, issn 0038-1098, 5 p.Article

Calibration method for rotating-analyzer ellipsometersDE NIJS, J. M. M; HOLTSLAG, A. H. M; VAN SILFHOUT, A et al.Journal of the Optical Society of America. A, Optics and image science. 1988, Vol 5, Num 9, pp 1466-1471, issn 0740-3232Article